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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices, by Paul van der Heide
Free PDF Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices, by Paul van der Heide
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Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
- Sales Rank: #3056486 in Books
- Brand: Van Der Heide, Paul
- Published on: 2014-09-15
- Original language: English
- Number of items: 1
- Dimensions: 9.50" h x 1.00" w x 6.40" l, 1.48 pounds
- Binding: Hardcover
- 384 pages
Review
“It is well worth owning if you want to learn about this exciting surface science technique for studying materials.” (IEEE Electrical Engineering magazine, 1 May 2015)
“The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method.” (Anal Bioanal Chem, 21 February 2015)
From the Back Cover
Secondary Ion Mass Spectrometry (SIMS) has become an indispensible, fully commercialized micro-analytical technique applied in a diverse range of fields spanning the Materials Sciences, Earth sciences and Bio-Sciences with new application field continually being uncovered. This book provides a pedagogic function as well as a research tool to anyone involved in any of these forms of SIMS (senior undergraduates through seasoned professionals within academia or industry).
This book does so by supplying a clear and definitive introduction to:
a) The fundaments of sputtering and secondary ion formation/survival inclusive of pertinent models for elemental and molecular emission
b) Both the theory and application, inclusive of modes of operation, of the latest instrumentation used in Static SIMS, Dynamic SIMS or Cluster SIMS
c) Data collection and processing protocols along with reasons for any distortions that can be introduced
Amalgamation of theory with experimental data from a practitioner’s perspective is the core feature of this book. This is aided through the use of numerous illustrations from highly diverse fields are included. All sections are prepared such that each can be read independently of each other. Commonly used reference tables, review questions, vendors and contacts and descriptions of related techniques presented in the Appendix.
About the Author
Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of SIMS at the University of Western Ontario, the University of Houston (where he also filled in various Professor level positions), Samsung Austin Semiconductor, and most recently at GlobalFoundries (NY). Paul has ~100 publications with this representing his 2nd book.
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